computer program peaks studio 7.0 Search Results


labsolutions 5 57 software  (Shimadzu Corporation)
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Shimadzu Corporation labsolutions 5 57 software
Labsolutions 5 57 Software, supplied by Shimadzu Corporation, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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labsolutions 5 57 software - by Bioz Stars, 2026-06
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chromatof software  (LECO Corporation)
90
LECO Corporation chromatof software
Chromatof Software, supplied by LECO Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Average 90 stars, based on 1 article reviews
chromatof software - by Bioz Stars, 2026-06
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midi sherlock peak identification software version 6.2  (MIDI Inc)
90
MIDI Inc midi sherlock peak identification software version 6.2
Midi Sherlock Peak Identification Software Version 6.2, supplied by MIDI Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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peak able-based leco chromatof® software version 4.50  (LECO Corporation)
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LECO Corporation peak able-based leco chromatof® software version 4.50
Peak Able Based Leco Chromatof® Software Version 4.50, supplied by LECO Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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bruker topspin software  (Bruker Corporation)
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Bruker Corporation bruker topspin software
Bruker Topspin Software, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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bruker topspin software - by Bioz Stars, 2026-06
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high score plus software xrd peaks  (Bruker Corporation)
99
Bruker Corporation high score plus software xrd peaks
Fig. 2. <t>XRD</t> <t>diffraction</t> pattern of (a) LSF, LSFN-10, LSFN-33, and LSFN-50, (b) XRD diffraction pattern of LSFN-50 with identification of additional phases of NiO, LaFeO3, and (La0.3Sr0.7)2FeO4. Data smoothing was applied to the four materials to enable a clearer comparison of the changes in the main peaks.
High Score Plus Software Xrd Peaks, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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high score plus software xrd peaks - by Bioz Stars, 2026-06
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flexanalysis v2 2 software  (Bruker Corporation)
99
Bruker Corporation flexanalysis v2 2 software
Fig. 2. <t>XRD</t> <t>diffraction</t> pattern of (a) LSF, LSFN-10, LSFN-33, and LSFN-50, (b) XRD diffraction pattern of LSFN-50 with identification of additional phases of NiO, LaFeO3, and (La0.3Sr0.7)2FeO4. Data smoothing was applied to the four materials to enable a clearer comparison of the changes in the main peaks.
Flexanalysis V2 2 Software, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/flexanalysis v2 2 software/product/Bruker Corporation
Average 99 stars, based on 1 article reviews
flexanalysis v2 2 software - by Bioz Stars, 2026-06
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linear regression analysis graphpad prim  (GraphPad Software Inc)
90
GraphPad Software Inc linear regression analysis graphpad prim
Fig. 2. <t>XRD</t> <t>diffraction</t> pattern of (a) LSF, LSFN-10, LSFN-33, and LSFN-50, (b) XRD diffraction pattern of LSFN-50 with identification of additional phases of NiO, LaFeO3, and (La0.3Sr0.7)2FeO4. Data smoothing was applied to the four materials to enable a clearer comparison of the changes in the main peaks.
Linear Regression Analysis Graphpad Prim, supplied by GraphPad Software Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Average 90 stars, based on 1 article reviews
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genomatix matinspector software  (Genomatix gmbh)
90
Genomatix gmbh genomatix matinspector software
Fig. 2. <t>XRD</t> <t>diffraction</t> pattern of (a) LSF, LSFN-10, LSFN-33, and LSFN-50, (b) XRD diffraction pattern of LSFN-50 with identification of additional phases of NiO, LaFeO3, and (La0.3Sr0.7)2FeO4. Data smoothing was applied to the four materials to enable a clearer comparison of the changes in the main peaks.
Genomatix Matinspector Software, supplied by Genomatix gmbh, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Average 90 stars, based on 1 article reviews
genomatix matinspector software - by Bioz Stars, 2026-06
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syntech software  (Syntech GmbH)
90
Syntech GmbH syntech software
Fig. 2. <t>XRD</t> <t>diffraction</t> pattern of (a) LSF, LSFN-10, LSFN-33, and LSFN-50, (b) XRD diffraction pattern of LSFN-50 with identification of additional phases of NiO, LaFeO3, and (La0.3Sr0.7)2FeO4. Data smoothing was applied to the four materials to enable a clearer comparison of the changes in the main peaks.
Syntech Software, supplied by Syntech GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/syntech software/product/Syntech GmbH
Average 90 stars, based on 1 article reviews
syntech software - by Bioz Stars, 2026-06
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windows 16.0  (SPSS Inc)
90
SPSS Inc windows 16.0
Fig. 2. <t>XRD</t> <t>diffraction</t> pattern of (a) LSF, LSFN-10, LSFN-33, and LSFN-50, (b) XRD diffraction pattern of LSFN-50 with identification of additional phases of NiO, LaFeO3, and (La0.3Sr0.7)2FeO4. Data smoothing was applied to the four materials to enable a clearer comparison of the changes in the main peaks.
Windows 16.0, supplied by SPSS Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/windows 16.0/product/SPSS Inc
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peak motus software  (Peak Performance Technologies Inc)
90
Peak Performance Technologies Inc peak motus software
Fig. 2. <t>XRD</t> <t>diffraction</t> pattern of (a) LSF, LSFN-10, LSFN-33, and LSFN-50, (b) XRD diffraction pattern of LSFN-50 with identification of additional phases of NiO, LaFeO3, and (La0.3Sr0.7)2FeO4. Data smoothing was applied to the four materials to enable a clearer comparison of the changes in the main peaks.
Peak Motus Software, supplied by Peak Performance Technologies Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/peak motus software/product/Peak Performance Technologies Inc
Average 90 stars, based on 1 article reviews
peak motus software - by Bioz Stars, 2026-06
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Image Search Results


Fig. 2. XRD diffraction pattern of (a) LSF, LSFN-10, LSFN-33, and LSFN-50, (b) XRD diffraction pattern of LSFN-50 with identification of additional phases of NiO, LaFeO3, and (La0.3Sr0.7)2FeO4. Data smoothing was applied to the four materials to enable a clearer comparison of the changes in the main peaks.

Journal: Journal of Environmental Chemical Engineering

Article Title: Development of Iron-Nickel Containing Perovskites with Increased Oxygen Carrier Capacity for Chemical Looping H2 Production

doi: 10.1016/j.jece.2024.115069

Figure Lengend Snippet: Fig. 2. XRD diffraction pattern of (a) LSF, LSFN-10, LSFN-33, and LSFN-50, (b) XRD diffraction pattern of LSFN-50 with identification of additional phases of NiO, LaFeO3, and (La0.3Sr0.7)2FeO4. Data smoothing was applied to the four materials to enable a clearer comparison of the changes in the main peaks.

Article Snippet: Fresh and after cycling (20 cycles) material is characterised by X-ray diffraction (XRD) with High score Plus software XRD peaks from a Bruker D8 Discover GIXRD Autochanger; X-ray photoelectron spectroscopy (XPS) for element distribution on the material’s surface is carried out using Kratos Axis Ultra and scanning electron microscopy with energy dispersive X-ray spectroscopy; FEI Quanta 200 Scanning Electron Microscopy with Energy Dispersive X-Ray Analysis (SEM-EDX) is used for the elemental analysis of the samples.

Techniques: Comparison